
FS-70
SERIES 378 — Microscope Unit for Semiconductor Inspection
ShortbasemodelNo.
FS70-S FS70-THS FS70Z-S FS70Z-THS FS70L-S FS70L-THS FS70L4-S FS70L4-THS
Order No. 378-184-2 378-184-4 378-185-2 378-185-4 378-186-2 378-186-4 378-187-2 378-187-4
Focusadjustment 50mmtravelrangewithconcentriccoarse(3.8mm/rev)andne(0.1mm/rev)focusingwheels(right/left)
Image Erectimage
Pupildistance Siedentopftype,adjustmentrange:51-76mm
Fieldnumber 24
Tiltangle — 0°-20° — 0°-20° — 0°-20° — 0°-20°
Opticalpassratio 50/50 100/0or
0/100
50/50 100/0or
0/100
100/0or0/100 100/0or0/100
Protectivelter — — Built-inlaserbeamlter Built-inlaserbeamlter
Tubelens 1X 1X-2Xzoom 1X 1X
Applicablelaser — — 1064/532/355nm 532/266nm
Cameramount C-mount(usingoptionaladapterB) UsealaserwithTVport. C-mountreceptacle
(withgreenlterswitch)
Illumination
system,optional
Reectiveilluminationforbrighteld(Koehlerillumination,withaperturediaphragm)
12V100Wber-optics,non-steppedadjustment,lightguidelength:1.5m,powerconsumption150W
Objective,optional
(forobservation)
MPlanApo,MPlanApoSL,GPlanApo
Objective,optional
(forlaser-cutting)
— M/LCDPlanNIR,
M/LCDPlanNUV
MPlanUV
Loading* 14.5kg 13.6kg 14.1kg 13.2kg 14.2kg 13.5kg 13.9kg 13.1kg
Mass(mainunit) 6.1kg 7.1kg 6.6kg 7.5kg 6.4kg 7.2kg 6.7kg 7.5kg
*Loadingonopticaltubeexcludingweightofobjectivelensesandeyepieces
SPECIFICATIONS
ModelNo. FS70 FS70-TH FS70Z FS70Z-TH FS70L FS70L-TH FS70L4 FS70L4-TH
Order No. 378-184-1 378-184-3 378-185-1 378-185-3 378-186-1 378-186-3 378-187-1 378-187-3
FEATURES
•Theopticalsystemthatwasoriginally
developedforthebest-sellingFS60
modelswasfurtherenhancedfortheFS70
models.Itisidealasthemicroscopeunit
ofaproberstationforsemiconductors.(All
modelsCEmarked.)
•TheFS70LsupportsthreetypesofYAG
laserwavelengthranges(1064nm,532nm
and355nm),whiletheFS70L4supports
twotypesofwavelengthranges(532nm
and266nm),thusexpandingthescopeof
laserapplications,allowinglaser-cutting
ofthin-lmsusedinsemiconductorsand
liquidcrystalsubstrates.However,Mitutoyo
assumesnoresponsibilitywhateverfor
theperformanceand/orsafetyofthelaser
systemusedwithMitutoyomicroscopes.
Acarefulexaminationisrecommendedin
selectingalaser-emissionunit.
•Brighteld,DifferentialInterference
Contrast(DIC)andpolarizedobservations
arestandardwiththeFS70Z.TheFS70L
andFS70L4donotsupporttheDIC
method.
•Byemployinganinwardturret,thelong
workingdistanceobjectivesprovide
excellentoperability.
•Anergonomicdesignwithsuperb
operability:theFS70employstheerect-
imageopticalsystem(theimageinthe
eldofviewhasthesameorientationas
thespecimen)andenlargednefocus
adjustmentwheelwithrubbergripcoarse-
adjustmentknob.
FS70Z FS70L FS70L4
Technical Data
Focusadjustment
•Method: Withconcentriccoarseandne
focusingwheels(rightandleft)
•Range: 50mmtravelrange
0.1mm/rev.forneadjustment,
3.8mm/rev.forcoarseadjustment
TrinoculartubeImage: Erectimage
Pupildistance: Siedentopftype,
adjustmentrange:51-76mm
Fieldnumber: 24
Tiltangle: 0º-20º(only-TH,-THSmodels)
Illuminationsystem: Reectiveilluminationforbrighteld
(Koehlerillumination,withaperture
diaphragm)
Lightsource: 12V100Wber-optics,
non-steppedadjustment,
lightguidelength1.5m,
powerconsumption150W
Objectives(optional): MPlanApo,MPlanApoSL,GPlan
Apo
RefertotheMicroscopeUnitsleaet(E4191)
formoredetails.
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